The 5th International conference on Design & Technology of

Integrated Systems in nanoscale era

(DTIS2010)

Hammamet, Tunisia

March 23-25, 2010

Conference Scope:

Integrated System Design :

• SOC, SIP design

• Multiprocessor systems

• Embedded systems

• Wireless systems

• Network on Chip

• Analog, Mixed Signal and RF systems

• MEMS and MOEMS systems

• Low Voltage and Low Power systems

• Innovative technologies

• Synthesis (physical, logic,...)

• Simulation, Validation and Verification

Integrated System Technology :

• Device modeling

• Material characterization

• Failure analysis

• New components

• Packaging

• Process technology

• Reliability issues

Integrated System Testing :

• Defect and fault modeling

• Analog and Mixed Signal testing

• MEMS/MOEMS testing

• SOC and SIP testing

• Delay testing

• Memory testing

• Fault Simulation, ATPG

• DFT, BIST and BISR

• On‐line testing and fault tolerant systems

• ATE issues

• Alternative test strategies

Important Dates:

• November 02, 2009 : Submission deadline

• December 22, 2009 : Notification of acceptance

• January 25, 2010 : Final version due date

 http://www.dtis-conference.net

نوشته شده توسط ایمان صادق خانی | لينك ثابت |